Digital Balance,Digital Balance,Digital Balance,Digital Balance,Digital Balance,Digital Balance,Digital Balance,Digital Balance,Digital Balance,Digital Balance,Digital Balance,Digital Balance,Van der Pauw Experiment,Van der Pauw Experiment,Van der Pauw Experiment,Van der Pauw Experiment,Van der Pauw Experiment,Van der Pauw Experiment,Van der Pauw Experiment,Van der Pauw Experiment,Van der Pauw Experiment,Van der Pauw Experiment,Van der Pauw Experiment,Van der Pauw Experiment,Characteristics of Photo Devices,Characteristics of Photo Devices,Characteristics of Photo Devices,Characteristics of Photo Devices,Characteristics of Photo Devices,Characteristics of Photo Devices,Characteristics of Photo Devices,Characteristics of Photo Devices,Characteristics of Photo Devices,Characteristics of Photo Devices,Characteristics of Photo Devices,Characteristics of Photo Devices,Two Probe Method for Resistivity Measurement of Insulators,Two Probe Method for Resistivity Measurement of Insulators,Two Pr
Ministry of Education › Department of Higher Education
GeMGovernment e-Marketplace (GeM)GeMOpen for bids
| Organisation | Ministry of Education |
|---|---|
| Department | Department of Higher Education |
| Tender value | Not stated by the portal |
| EMD | Not stated by the portal |
| Last date for bids | 30 Nov 2026, 05:30 pm (open) |
| Published | 09 Nov 2026 |
| Tender type | Bid |
| Category | GeM / Digital Balance,Van der Pauw Experiment,Characteristics of Photo Devices,Two Probe Method for Resis |
| Source | Government e-Marketplace (GeM) |
Scope of work
Digital Balance,Digital Balance,Digital Balance,Digital Balance,Digital Balance,Digital Balance,Digital Balance,Digital Balance,Digital Balance,Digital Balance,Digital Balance,Digital Balance,Van der Pauw Experiment,Van der Pauw Experiment,Van der Pauw Experiment,Van der Pauw Experiment,Van der Pauw Experiment,Van der Pauw Experiment,Van der Pauw Experiment,Van der Pauw Experiment,Van der Pauw Experiment,Van der Pauw Experiment,Van der Pauw Experiment,Van der Pauw Experiment,Characteristics of Photo Devices,Characteristics of Photo Devices,Characteristics of Photo Devices,Characteristics of Photo Devices,Characteristics of Photo Devices,Characteristics of Photo Devices,Characteristics of Photo Devices,Characteristics of Photo Devices,Characteristics of Photo Devices,Characteristics of Photo Devices,Characteristics of Photo Devices,Characteristics of Photo Devices,Two Probe Method for Resistivity Measurement of Insulators,Two Probe Method for Resistivity Measurement of Insulators,Two Probe Method for Resistivi
Tender ID / NIT, tender fee, inviting authority, contacts, documents and the portal link are for businesses onboarded on QuantProc Sourcing (free).
More tenders from Ministry of Education
- Electric Potter Wheel (V2)Ministry of Education · closes 11 Nov 2026
- Constant load stress corrosion cracking testing set upMinistry of Education · closes 11 Nov 2026
- Weightlifting Barbell SetMinistry of Education · closes 11 Nov 2026
- Entry and Mid Level Desktop Computer,Computer Printer (V2),Line Interactive UPS with AVR (V2)Ministry of Education · closes 11 Nov 2026
- Hydraulic Basketball Projection with Back Board & Dunking RimMinistry of Education · closes 11 Nov 2026
- CAPACITANCE DEIONISATION SETUPMinistry of Education · closes 11 Nov 2026
- Operation And Maintenance Of Lifts (Elevators) - Complete SystemMinistry of Education · closes 11 Nov 2026
- Victory Stand,Ball Pumper,Score Board,Agility Ladder for Speed Fitness,Tug of war Rope,Carrom Board,Catching Bat,Catching Board,Cricket…Ministry of Education · closes 11 Nov 2026